Talks and Poster Presentations (with Proceedings-Entry):
V. S. Veeravalli, A. Steininger:
"Monitoring Single Event Transient Effects in Dynamic Mode";
Talk: 1st Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2012),
- 2012-06-01; in: "1st Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2012)",
Our aim is to investigate whether the susceptibility of a circuit, particularly an asynchronous one, to radiation is influenced by its activity. To this end we want to subject the target circuits to radiation during different degrees of activity. The problem here is to distinguish between transitions caused by this regular activity, and those caused by particle hits. Our solution is a difference counter that receives one input from the target device and the other one from an identical device serving as a fault free reference. We present an efficient implementation of this counter, based on Muller C-elements and show how it can be effectively protected against particle hits. We support our claims by an implementation of the circuit that we subject to radiation with analog simulations.
Created from the Publication Database of the Vienna University of Technology.