Contributions to Books:
S. Ahmed, M. Nedjalkov, D. Vasileska:
"Comparative Study of Various Self-Consistent Event Biasing Schemes for Monte Carlo Simulations of Nanoscale MOSFETs";
in: "Theory and Applications of Monte Carlo Simulations",
V. Chan (ed.);
Intech Open Access Publisher,
2013,
ISBN: 978-953-51-1012-5,
109
- 133.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.5772/53113
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/BC2013_Nedjalkov_1.pdf
Created from the Publication Database of the Vienna University of Technology.