Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, B. Kaczer, H. Reisinger, P.-J. Wagner, M. Toledano-Luque:
"Modeling of the bias temperature instability under dynamic stress and recovery conditions";
Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT),
Xi'an, China (invited);
10-29-2012
- 11-01-2012; in: "11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)",
(2012),
ISBN: 978-1-4673-2474-8;
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ICSICT.2012.6466737
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Grasser_4.pdf
Created from the Publication Database of the Vienna University of Technology.