Publications in Scientific Journals:
I. Starkov, H. Enichlmair:
"Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in Long-Channel n-MOSFETs";
Journal of Vacuum Science & Technology B,
31
(2013),
1;
01A118-1
- 01A118-7.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1116/1.4774106
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2013_Starkov_4.pdf
Created from the Publication Database of the Vienna University of Technology.