Publications in Scientific Journals:
B. Kaczer, M. Toledano-Luque, W. Gös, T. Grasser, G. Groeseneken:
"Gate Current Random Telegraph Noise and Single Defect Conduction";
Microelectronic Engineering,
109
(2013),
123
- 125.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.mee.2013.03.110
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2013_Goes_1.pdf
Created from the Publication Database of the Vienna University of Technology.