Publications in Scientific Journals:
M. I. Vexler, S. E. Tyaginov, Yu. Illarionov, Y. K. Sing, A. D. Shenp, V. V. Fedorov, D. V. Isakov:
"A General Simulation Procedure for the Electrical Characteristics of Metal Insulator Semiconductor Tunnel Structures";
Semiconductors (Physics of Semiconductor Devices),
47
(2013),
5;
686
- 694.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1134/S1063782613050230
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2013_Illarionov_2.pdf
Created from the Publication Database of the Vienna University of Technology.