Publications in Scientific Journals:
G. Pobegen, S. E. Tyaginov, M. Nelhiebel, T. Grasser:
"Observation of Normally Distributed Energies for Interface Trap Recovery After Hot-Carrier Degradation";
IEEE Electron Device Letters,
34
(2013),
8;
939
- 941.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/LED.2013.2262521
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/JB2013_Grasser_3.pdf
Created from the Publication Database of the Vienna University of Technology.