Talks and Poster Presentations (with Proceedings-Entry):
B. Kaczer, V. Afanas´Ev, K. Rott, F. Cerbu, J. Franco, W. Gös, T. Grasser, O. Madia, D. Nguyen, A. Stesmans, H. Reisinger, M. Toledano-Luque, P. Weckx:
"Experimental characterization of BTI defects";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Glasgow, Scotland, United Kingdom (invited);
2013-09-03
- 2013-09-05; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",
(2013),
ISBN: 978-1-4673-5733-3;
444
- 450.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/SISPAD.2013.6650670
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Goes_2.pdf
Created from the Publication Database of the Vienna University of Technology.