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M.N. Durakbasa, G. Bas, J.M. Bauer, L. Kräuter:
"Development of an advanced metrology and intelligent quality management as a strategic approach in manufacturing industry";
Hauptvortrag: ISMQC - International Symposium on Measurement and Quality Control, Krakow-Kielce, Polen; 11.09.2013 - 13.09.2013; in: "Proceedings of the 11th International Symposium on Measurement and Quality Control", Osaka University, (2013), 4 S.

Manufacturing industry faces challenges of global
competition dealing with increasing cost of energy and raw
material as well as meeting higher customer quality and
product technology expectations. In the next decade, the
progress of technology will require main aspects of
strategies for international acceptance and competitiveness.
The modern methods of quality management intelligently
integrated with environmental management and energy
management will be the main strategy developed and refined
in manufacturing organizations where advanced metrology
enable to perform industrial and technological developments
by practicing high precise measurement tasks and essential
measurement know-how within the sophisticated production
systems.
This paper proposes a strategic approach to develop an
advanced metrology and intelligent quality management
applicable in manufacturing industry by firstly modelling,
generating and experimenting an inter-university network
that accesses, cooperates and operates at distance in the
laboratory of two distant research laboratories namely the
nanotechnology laboratory AuM-TuWien in Austria and the
control laboratory UTN-FRBA in Argentina. The key
factors to fulfil the main target are defined and discussed in
the application model where the indicators are of
compliance to the advanced metrology and intelligent
quality management system strategy as a conclusion.

Nanometrology, Quality management, Intelligent, Manufacturing industry, Telepresence