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T. Makgato, E. Sideras-Haddad, S. Shrivastava, T. Schenkel, R. Ritter, G. Kowarik, F. Aumayr, J.R. Crespo López-Urrutia, S. Bernitt, C. Beilmann, R. Ginzel:
"Highly charged ion impact induced nanodefects in diamond";
Nuclear Instruments & Methods in Physics Research Section B, 314 (2013), 135 - 139.

We investigate the interaction of slow highly charged ion (SHCI) beams with insulating type Ib diamond
(111) surfaces. Bismuth and Xenon SHCI beams produced using an Electron Beam Ion Trap (EBIT) and an
Electron Cyclotron Resonance source (ECR) respectively, are accelerated onto type Ib diamond (111) surfaces
with impact velocities up to 0.4 tBohr. SHCIs with charge states corresponding to potential energies
between 4.5 keV and 110 keV are produced for this purpose. Atomic Force Microscopy analysis
(AFM) of the diamond surfaces following SHCI impact reveals surface morphological modifications characterized
as nanoscale craters (nano-craters). To interpret the results from Tapping Mode AFM analysis of
the irradiated diamond surfaces we discuss the interplay between kinetic and potential energy in nanocrater
formation using empirical data together with Stopping and Range of Ions in Matter (SRIM) Monte
Carlo Simulations.

Diamond Highy charged ions Nanostructuring Nano-craters Electron beam ion trap