Books and Book Editorships:
T. Grasser (ed.):
"Bias Temperature Instability for Devices and Circuits";
Springer Science+Business Media New York,
2013,
ISBN: 978-1-4614-7908-6;
810 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-1-4614-7909-3
Electronic version of the publication:
http://www.iue.tuwien.ac.at/index.php?id=bias_temperature_instability
Created from the Publication Database of the Vienna University of Technology.