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D. Schrempf, W. Meissl, F. Aumayr:
"An ultra-compact setup for measuring ion-induced electron emission statistics";
Nuclear Instruments & Methods in Physics Research Section B, 317 (2013), 44 - 47.

Important studies on electron emission phenomena during energetic projectile impact (ions, atoms, electrons)
on surfaces are based on the so-called electron emission statistics (EES) technique. In this contribution
a novel and very compact version of such an EES detection scheme is presented which no longer
requires a heavy NIM-crate with power supply to be operated at high voltage potential. These parts are
replaced by small and low cost electronic components, which can be operated using a battery pack only.
Even the pulse height analysis is now performed at high voltage and just the resulting pulse height spectrum
is communicated by optical fibers to the measurement PC at ground potential. EES-spectra for Ar9+
ion impact on Au are presented to demonstrate the performance of this new EES measurement setup.