Talks and Poster Presentations (with Proceedings-Entry):
J. Franco, B. Kaczer, Ph. J. Roussel, J. Mitard, S. Sioncke, L. Witters, H. Mertens, T. Grasser, G. Groeseneken:
"Understanding the Suppressed Charge Trapping in Relaxed- and Strained Ge/SiO2/HfO2 pMOSFETs and Implications for the Screening of Alternative High-Mobility Substrate/Dielectric CMOS Gate Stacks";
Talk: IEEE International Electron Devices Meeting (IEDM),
Washington, DC, USA;
2013-12-09
- 2013-12-11; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2013),
397
- 400.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2013.6724634
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Grasser_3.pdf
Created from the Publication Database of the Vienna University of Technology.