Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, K. Rott, H. Reisinger, M. Waltl, P.-J. Wagner, F. Schanovsky, W. Gös, G. Pobegen, B. Kaczer:
"Hydrogen-Related Volatile Defects as the Possible Cause for the Recoverable Component of NBTI";
Talk: IEEE International Electron Devices Meeting (IEDM),
Washington, DC, USA;
2013-12-09
- 2013-12-11; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2013),
409
- 412.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2013.6724637
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.