Publications in Scientific Journals:
H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
"Reliability Analysis and Comparison of Implication and Reprogrammable Logic Gates in Magnetic Tunnel Junction Logic Circuits";
IEEE Transactions on Magnetics,
49
(2013),
12;
5620
- 5628.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TMAG.2013.2278683
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/JB2013_Mahmoudi_2.pdf
Created from the Publication Database of the Vienna University of Technology.