Talks and Poster Presentations (with Proceedings-Entry):

W. Gös, M. Toledano-Luque, F. Schanovsky, M. Bina, O. Baumgartner, B. Kaczer, T. Grasser:
"Multi-Phonon Processes as the Origin of Reliability Issues";
Talk: Meeting of the Electrochemical Society (ECS), San Francisco, USA (invited); 10-27-2013 - 11-01-2013; in: "ECS Transactions 2013 - "Semiconductors, Dielectrics, and Materials for Nanoelectronics 11"", 58/7/ (2013), 31 - 47.

"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)

Electronic version of the publication:

Created from the Publication Database of the Vienna University of Technology.