Talks and Poster Presentations (with Proceedings-Entry):
W. Gös, M. Toledano-Luque, F. Schanovsky, M. Bina, O. Baumgartner, B. Kaczer, T. Grasser:
"Multi-Phonon Processes as the Origin of Reliability Issues";
Talk: Meeting of the Electrochemical Society (ECS),
San Francisco, USA (invited);
10-27-2013
- 11-01-2013; in: "ECS Transactions 2013 - "Semiconductors, Dielectrics, and Materials for Nanoelectronics 11"",
58/7/
(2013),
31
- 47.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/05807.0031ecst
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2013/CP2013_Goes_3.pdf
Created from the Publication Database of the Vienna University of Technology.