Talks and Poster Presentations (with Proceedings-Entry):

L. Anghel, V. S. Veeravalli, D. Alexandrescu, A. Steininger, K. Schneider, E. Costenaro:
"Single Event Effects in Muller C-Elements and Asynchronous Circuits Over a Wide Energy Spectrum";
Talk: 2014 IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE 10), Stanford University, USA; 2014-04-01 - 2014-04-02; in: "Proceedings 2014 IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE 10)", (2014), 6 pages.

English abstract:
The C-element is the critical component of asynchronous circuits' control paths. This paper presents a complete analysis of the effect of radiation particle hits on a Van-Berkel C-element in 90nm bulk technology. The alpha particles, neutrons and heavy ions results show significant intrinsic sensitivity to Single Event Transients and Single Event Upsets. Furthermore, we propose a static and dynamic state-aware analysis of individual gates and more complex asynchronous
elements. The methodology allows evaluating the vulnerability intervals of the asynchronous circuit for a given application and implementation, highlighting rendezvous phases where the Celement is susceptible to SEUs, disrupting circuit behavior and requiring a null wave to recover. The results of the analysis can be exploited to predict and improve circuit reliability performance.

Created from the Publication Database of the Vienna University of Technology.