Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, G. Rzepa, M. Waltl, W. Gös, K. Rott, G.A. Rott, H. Reisinger, J. Franco, B. Kaczer:
"Characterization and Modeling of Charge Trapping: From Single Defects to Devices";
Talk: IEEE International Conference on IC Design and Technology (ICICDT),
Austin, TX, USA (invited);
2014-05-28
- 2014-05-30; in: "Proceedings of IEEE International Conference on IC Design and Technology",
(2014),
ISBN: 978-1-4799-2153-9;
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ICICDT.2014.6838620
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2014_Grasser_02.pdf
Created from the Publication Database of the Vienna University of Technology.