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Publications in Scientific Journals:

T. Aichinger, M. Nelhiebel, T. Grasser:
"Refined NBTI Characterization of Arbitrarily Stressed PMOS Devices at Ultra-low and Unique Temperatures";
Microelectronics Reliability, 53 (2013), 7; 937 - 946.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2013.03.007

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Grasser_1.pdf


Created from the Publication Database of the Vienna University of Technology.