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Vorträge und Posterpräsentationen (ohne Tagungsband-Eintrag):

M.N. Durakbasa, J.M. Bauer, G. Bas, D. Riepl:
"Micro And Nanometrology Laboratory Applications In Industry And Education By Telepresence And Teleoperation Remotely In The Global Village";
Vortrag: 11th International Conference on Remote Engineering and Virtual Instrumentation REV2014, Porto, Portugal; 26.02.2014 - 28.02.2014.



Kurzfassung englisch:
Manufacturing industry faces challenges of global competition dealing with increasing cost of energy and raw material as well as meeting higher customer quality and product technology expectations. In the next decade, the progress of technology will require main aspects of strategies for international acceptance and competitiveness. The modern methods of quality management intelligently integrated with environmental management and energy management will be the main strategy developed and refined in manufacturing organizations where advanced metrology enable to perform industrial and technological developments by practicing high precise measurement tasks and essential measurement know-how within the sophisticated production systems.
This paper proposes a strategic approach to develop an advanced metrology and intelligent quality management applicable in manufacturing industry by firstly modelling, generating and experimenting an inter-university network that accesses, cooperates and operates at distance in the laboratory of two distant research laboratories namely the nanotechnology laboratory AuM - TU Wien in Austria and the control laboratory UTN-FRBA in Argentina. The key factors to fulfil the main target are defined and discussed in the application model where the indicators are of compliance to the advanced metrology and intelligent quality management system strategy as a conclusion.

Schlagworte:
Nanometrology, Quality management, Intelligent, Manufacturing industry, Telepresence

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.