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Zeitschriftenartikel:

M. Stöger-Pollach:
"A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEM";
Ultramicroscopy, 145 (2014), S. 94 - 97.



Kurzfassung englisch:
The present work is a short note on the performance of a conventional transmission electron microscope (TEM) being operated at very low beam energies (below 20 keV). We discuss the high tension stability
and resolving power of this uncorrected TEM. We find out that the theoretical lens performance can nearly be achieved in practice. We also demonstrate that electron energy loss spectra can be recorded at
these low beam energies with standard equipment. The signal-to-noise ratio is sufficiently good for further data treatment like multiple scattering deconvolution and Kramers - Kronig analysis.

Schlagworte:
Low voltage TEM, Low voltage EELS, Electron conversion, Resolution


Elektronische Version der Publikation:
http://ac.els-cdn.com/S0304399114000187/1-s2.0-S0304399114000187-main.pdf?_tid=eac14420-373b-11e4-a5d1-00000aab0f6c&acdnat=1410169300_d621a777f6b6915350bc43878324dff0


Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.