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Zeitschriftenartikel:

F. Tian, P. Schattschneider, M. Stöger-Pollach:
"The post-peak spectra in electron energy loss near edge structure";
Ultramicroscopy, 136 (2014), 136; S. 160 - 164.



Kurzfassung englisch:
The origin of post-peak spectra in electron energy loss near edge structure (ELNES) spectra of pure Ni and NiO is investigated through
ab initio calculation. Contrary to the general view that post-peak spectra in ELNES are generated by transitions to continuum states, it is found that orbit hybridization is the main cause of post-peak spectra in the low energy range above the Fermi level based on the calculation of electronic structure and ELNES. Reasons for the intensity differences of the simulated and experimental spectra are discussed. This work contributes to the understanding of ELNES and to the quantification of ELNES spectra.

Schlagworte:
Post-peak spectrum, ELNES, Electron microscopy, Quantitative analysis


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.ultramic.2013.10.008

Elektronische Version der Publikation:
http://ac.els-cdn.com/S0304399113002830/1-s2.0-S0304399113002830-main.pdf?_tid=c34275e2-38ce-11e4-a150-00000aacb35e&acdnat=1410342321_96a07d8309baf7400e87b57bd08a30ef


Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.