Publications in Scientific Journals:
M. Tapajna, N. Killat, V. Palankovski, D. Gregusova, K. Cico, J. Carlin, N. Grandjean, M. Kuball, J. Kuzmik:
"Hot-Electron-Related Degradation in InAlN/GaN High-Electron-Mobility Transistors";
IEEE Transactions on Electron Devices,
61
(2014),
8;
2793
- 2801.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2014.2332235
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Palankovski_1.pdf
Created from the Publication Database of the Vienna University of Technology.