Publications in Scientific Journals:
M. Molnar, D. Donoval, J. Kuzmik, J. Marek, A. Chvala, P. Pribytny, V. Mikolasek, K. Rendek, V. Palankovski:
"Simulation Study of Interface Traps and Bulk Traps in n++GaN/InAlN/AlN/GaN High Electron Mobility Transistors";
Applied Surface Science,
312
(2014),
157
- 161.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.apsusc.2014.04.078
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Palankovski_2.pdf
Created from the Publication Database of the Vienna University of Technology.