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Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

S. Biffl, A. Lüder, N. Schmidt, D. Winkler:
"Early and Efficient Quality Assurance of Risky Technical Parameters in a Mechatronic Design Process";
Vortrag: 40th Annual Conference of the IEEE Industrial Electronics Society (IECON 2014), Dallas, Texas; 28.10.2014 - 01.11.2014; in: "Proceedings of the 40th Annual Conference of the IEEE Industrial Electronics Society (IECON 2014)", IEEE, (2014).



Kurzfassung englisch:
Mechatronic design processes in automation systems
engineering projects require concurrent engineering of various
disciplines operating within technical, commercial, and
project management constraints. Unfortunately, early and efficient
quality assurance of technical parameters, which affect
risk-relevant constraints in the mechatronic design processes, is
difficult and error-prone due to the heterogeneous local model
representations of shared concepts that the domain experts use to
define these constraints. In this paper, we investigate the effectiveness
and efficiency of the adapted multi-model dashboard
(MMD) approach and a traditional approach for monitoring
technical parameters and constraints in mechatronic design
processes. We evaluate these approaches in the context of a realworld
use case, the welding line process for automobile parts.
Major results are: the MMD process was at least as effective and
efficient in eliciting relevant project constraints and model dependencies
as traditional approaches in the evaluation context.

Schlagworte:
Risk Management for Manufacturing Systems Engineering, Mechatronic Engineering Process, Quality Assurance

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.