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G. Ramer, A. Balbekova, B. Lendl:
"Resonant Photoexpansion Infrared Nanoscopy - towards robust and time-resolved measurements";
Vortrag: SCIX 2014, Reno, Nevada, US (eingeladen); 28.09.2014 - 03.10.2014; in: "Final Program Book of Abstracts", (2014), S. 173.

We evaluate the influence of substrate properties and sample thickness on the signal in top illumination resonant AFMIR. While such evaluations have been performed for commercially available ATR type illumination ring down AFMIR (nanoIR, Anasys Instruments) similar data has so far not been available for resonant AFMIR.

To perform our evaluation we employ a setup that is specifically geared towards keeping the angle of incidence constant while varying the position of the focal spot. Our setup consists of a Daylight solution EC-QCL emitting in the amide I (1565 - 1730 cm-1) range, an Agilent 5400 AFM and an optical system that allows finely adjust the location of the focal spot of the laser beam towards the AFM cantilever while keeping the angle of incidence constant. We use purely reflective optics to reduce the dispersion in our optical system.

We will also demonstrate how AFMIR can be used to follow a solid-gas reaction at a spatial resolution in the nanometer scale in real time.