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Publications in Scientific Journals:

Y Voronko, B. Chernev, G Eder:
"Spectroscopic investigations on thin adhesive layers in multi-material laminates";
Applied Spectroscopy, 68 (2014), 5; 584 - 592.



English abstract:
Three different spectroscopic approaches, Raman linescans,
Raman imaging, and attenuated total reflection Fourier transform
infrared spectroscopy (ATR FT-IR) imaging were evaluated for the
visualization of the thin adhesive layers (3-6 lm) present in
polymeric photovoltaic backsheets. The cross-sections of the
multilayer laminates in the original, weathered, and artificially aged
samples were investigated spectroscopically in order to describe
the impact of the environmental factors on the evenness and
thickness of the adhesive layers. All three methods were found to
be suitable tools to detect and visualize these thin layers within the
original and aged polymeric laminates. However, as the adhesive
layer is not very uniform in thickness and partly disintegrates upon
weathering and/or artificial aging, Raman linescans yield only
qualitative information and do not allow for an estimation of the
layer thickness. Upon increasing the measuring area by moving
from one-dimensional linescans to two-dimensional Raman images,
a much better result could be achieved. Even though a longer
measuring time has to be taken into account, the information on the
uniformity and evenness of the adhesive layer obtainable using the
imaging technique is much more comprehensive. Although Raman
spectroscopy is known to have the superior lateral resolution as
compared with ATR FT-IR spectroscopy, the adhesive layers of the
samples used within this study (layer thickness 3-6 lm) could also
be detected and visualized by applying the ATR FT-IR spectroscopic
imaging method. However, the analysis of the images was
quite a demanding task, as the thickness of the adhesive layer was
in the region of the resolution limit of this method. The information
obtained for the impact of artificial aging and weathering on the
adhesive layer obtained using Raman imaging and ATR FT-IR
imaging was in good accordance.

Keywords:
Raman imaging; Infrared spectroscopy; ATR FT-IR imaging; Photovoltaic; Backsheet; Adhesive


"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1366/13-07291


Created from the Publication Database of the Vienna University of Technology.