Books and Book Editorships:
T. Grasser (ed.):
"Hot Carrier Degradation in Semiconductor Devices";
Springer International Publishing,
2014,
ISBN: 978-3-319-08993-5;
517 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-319-08994-2
Electronic version of the publication:
http://www.iue.tuwien.ac.at/index.php?id=hot_carrier_degradation
Created from the Publication Database of the Vienna University of Technology.