Contributions to Books:
W. Gös, F. Schanovsky, T. Grasser:
"Advanced Modeling of Oxide Defects";
in: "Bias Temperature Instability for Devices and Circuits",
T. Grasser (ed.);
Springer New York,
2013,
ISBN: 978-1-4614-7909-3,
409
- 446.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-1-4614-7909-3_16
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/BC2014_Goes_1.pdf
Created from the Publication Database of the Vienna University of Technology.