Publications in Scientific Journals:
G.A. Rott, K. Rott, H. Reisinger, W. Gustin, T. Grasser:
"Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel Transistors";
Microelectronics Reliability,
54
(2014),
9-10;
2310
- 2314.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2014.07.040
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Grasser_3.pdf
Created from the Publication Database of the Vienna University of Technology.