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Publications in Scientific Journals:

J. Franco, B. Kaczer, M. Toledano-Luque, Ph. J. Roussel, M. Choa, T. Kauerauf, J. Mitard, G. Eneman, L. Witters, T. Grasser, G. Groeseneken:
"Superior Reliability of High Mobility (Si)Ge Channel pMOSFETs";
Microelectronic Engineering, 109 (2013), 250 - 256.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.mee.2013.03.001

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Grasser_6.pdf


Created from the Publication Database of the Vienna University of Technology.