Talks and Poster Presentations (with Proceedings-Entry):
J. Franco, B. Kaczer, N. Waldron, Ph. J. Roussel, A. Alian, M. Pourghaderi, Z. Ji, T. Grasser, T. Kauerauf, S. Sioncke, N. Collaert, A. Thean, G. Groeseneken:
"RTN and PBTI-induced Time-Dependent Variability of Replacement Metal-Gate High-k InGaAs FinFETs";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco, CA, USA;
12-15-2014
- 12-17-2014; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2014),
ISBN: 978-1-4799-8001-7;
506
- 509.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2014.7047087
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.