Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, W. Gös, Y. Wimmer, F. Schanovsky, G. Rzepa, M. Waltl, K. Rott, H. Reisinger, V. Afanas´Ev, A. Stesmans, A. El-Sayed, A. Shluger:
"On the Microscopic Structure of Hole Traps in pMOSFETs";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco, CA, USA;
12-15-2014
- 12-17-2014; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2014),
ISBN: 978-1-4799-8001-7;
530
- 533.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2014.7047093
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Grasser_3.pdf
Created from the Publication Database of the Vienna University of Technology.