Contributions to Books:
S. E. Tyaginov:
"Physics-Based Modeling of Hot-Carrier Degradation";
in: "Hot Carrier Degradation in Semiconductor Devices",
T. Grasser (ed.);
Springer International Publishing,
2015,
ISBN: 978-3-319-08993-5,
105
- 150.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-319-08994-2_4
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/BC2014_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.