Publications in Scientific Journals:
M. I. Vexler, Yu. Illarionov, S. E. Tyaginov, T. Grasser:
"Adaptation of the Model of Tunneling in a Metal/CaF2/Si(111) System for Use in Industrial Simulators of MIS Devices";
Semiconductors (Physics of Semiconductor Devices),
49
(2015),
2;
259
- 263.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1134/S1063782615020207
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2015_Illarionov_7.pdf
Created from the Publication Database of the Vienna University of Technology.