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Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

M.N. Durakbasa, G. Bas, D. Riepl, J.M. Bauer:
"An Innovative Educational Concept of Teleworking in the High Precision Metrology Laboratory to Develop a Model of Implementation in the Advanced Manufacturing Industry";
Vortrag: 2015 12th International Conference on Remote Engineering and Virtual Instrumentation (REV), Bangkok, Thailand; 25.02.2015 - 28.02.2015; in: "IEEE Conference Publications", IEEE, (2015), ISBN: 978-1-4799-7838-0; Paper-Nr. DOI: 10.1109/REV.2015.7087288, 7 S.



Kurzfassung englisch:
The production of very precise components goes hand in hand with the development of the necessary metrology, and a wide range of measuring instruments has been devised to cater for the evaluation of surfaces and structures down to the nanometric scale. The advancement in the industry requires this special infrastructure, equipment and expertise that are of high cost if integrated into the organization.

Schlagworte:
advanced integrated management system, intelligent metrology, micro and nanotechnology, remote control, smart


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/REV.2015.7087288


Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.