Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

M.N. Durakbasa, G. Bas:
"An Analysis Of The Metrology Techniques To Improve Quality And Accuracy";
Vortrag: XXIX. microCAD International Multidisciplinary Scientific Conference, Ungarn; 09.04.2015 - 10.04.2015; in: "MultiScience - XXIX. microCAD International Multidisciplinary Scientific Conference", ITTC Innovation and Technology Transfer Centre, University of Miskolc (2015), ISBN: 978-963-358-061-5; Paper-Nr. D1-1, 7 S.

Kurzfassung englisch:
Today´s continuous sophistication of products requires quality control and quality assurance to ensure specifications and relevant norm compliance. The objective of quality control is eliminating errors and integrating continuous improvement in the processes by means of accurate measurement devices. However, every quantitative indication of the quality has a level of uncertainty based on the measurement techniques. Therefore, ideal measurement is defined with standards and guidelines for more precise and accurate measurement and evaluation.
This study focuses on high precision metrology techniques that have been an indispensible part of the advanced production industry. The parameters affecting the uncertainty of the measurements are defined and experimental measurements are carried out to develop procedures in order to improve the accuracy of the measurements.

quality, accuracy, high precision, micro-/nanometrology

Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.