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Talks and Poster Presentations (with Proceedings-Entry):

Y. Wimmer, S. E. Tyaginov, F. Rudolf, K. Rupp, M. Bina, H. Enichlmair, J.M. Park, R. Minixhofer, H. Ceric, T. Grasser:
"Physical Modeling of Hot-Carrier Degradation in nLDMOS Transistors";
Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 10-12-2014 - 10-16-2014; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", IEEE, (2014), ISBN: 978-1-4799-7308-8; 58 - 62.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2014.7049511

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Wimmer_1.pdf


Created from the Publication Database of the Vienna University of Technology.