Talks and Poster Presentations (with Proceedings-Entry):
S. E. Tyaginov, M. Bina, J. Franco, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, B. Kaczer, H. Ceric, T. Grasser:
"Dominant Mechanism of Hot-Carrier Degradation in Short- and Long-Channel Transistors";
Talk: IEEE International Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
10-12-2014
- 10-16-2014; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2014),
ISBN: 978-1-4799-7308-8;
63
- 68.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2014.7049512
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Tyaginov_3.pdf
Created from the Publication Database of the Vienna University of Technology.