Talks and Poster Presentations (with Proceedings-Entry):
B. Kaczer, J. Franco, M. Cho, T. Grasser, P. Roussel, S. E. Tyaginov, M. Bina, Y. Wimmer, L. M. Procel, L. Trojman, F. Crupi, G. Pitner, V. Putcha, P. Weckx, E. Bury, Z. Ji, A. De Keersgieter, T. Chiarella, N. Horiguchi, G Groeseneken, A. Thean:
"Origins and Implications of Increased Channel Hot Carrier Variability in nFinFETs";
Talk: International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2015-04-19
- 2015-04-23; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
(2015),
6 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2015.7112706
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Grasser_4.pdf
Created from the Publication Database of the Vienna University of Technology.