Talks and Poster Presentations (with Proceedings-Entry):
P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
"A Model for Hot-Carrier Degradation in nLDMOS Transistors Based on the Exact Solution of the Boltzmann Transport Equation Versus the Drift-Diffusion Scheme";
Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
Bologna, Italy;
2015-01-26
- 2015-01-28; in: "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)",
IEEE,
(2015),
21
- 24.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ULIS.2015.7063763
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Sharma_1.pdf
Created from the Publication Database of the Vienna University of Technology.