Publications in Scientific Journals:
P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, M. Bina, H. Enichlmair, J.M. Park, R. Minixhofer, H. Ceric, T. Grasser:
"Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation";
IEEE Transactions on Electron Devices,
62
(2015),
6;
1811
- 1818.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2015.2421282
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2015_Sharma_1.pdf
Created from the Publication Database of the Vienna University of Technology.