Publications in Scientific Journals:
A. El-Sayed, M. Watkins, T. Grasser, V. Afanas´Ev, A. Shluger:
"Hole Trapping at Hydrogenic Defects in Amorphous Silicon Dioxide";
Microelectronic Engineering,
147
(2015),
141
- 144.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.mee.2015.04.073
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2015_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.