Talks and Poster Presentations (with Proceedings-Entry):
Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, T. Müller, M. Lemme, T. Grasser:
"Hot-Carrier Degradation in Single-Layer Double-Gated Graphene Field-Effect Transistors";
Talk: International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
04-19-2015
- 04-23-2015; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
IEEE,
(2015),
XT.2.1
- XT.2.6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2015.7112834
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Illarionov_2.pdf
Created from the Publication Database of the Vienna University of Technology.