Talks and Poster Presentations (with Proceedings-Entry):
K. Giering, C. Sohrmann, G. Rzepa, L. Heiß, T. Grasser, R. Jancke:
"NBTI Modeling in Analog Circuits and its Application to Long-Term Aging Simulations";
Talk: IEEE International Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
10-12-2014
- 10-16-2014; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
IEEE,
(2014),
ISBN: 978-1-4799-7308-8;
29
- 34.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2014.7049501
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2014_Rzepa_2.pdf
Created from the Publication Database of the Vienna University of Technology.