Talks and Poster Presentations (with Proceedings-Entry):
J. Franco, B. Kaczer, P. Roussel, E. Bury, H. Mertens, R. Ritzenthaler, T. Grasser, N. Horiguchi, A. Thean, G Groeseneken:
"NBTI in Si 0.55 Ge 0.45 Cladding p-FinFETs: Porting the Superior Reliability from Planar to 3D Architectures";
Talk: International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2015-04-19
- 2015-04-23; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
IEEE,
(2015),
2F.4.1
- 2F.4.5.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2015.7112694
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/CP2015_Grasser_6.pdf
Created from the Publication Database of the Vienna University of Technology.