Contributions to Books:
B. Kaczer, T. Grasser, J. Franco, M. Toledano-Luque, Ph. J. Roussel, M. Cho, E. Simoen, G. Groeseneken:
"Recent Trends in Bias Temperature Instability";
in: "Circuit Design for Reliability",
R. Reis, Y. Cao, G. Wirth (ed.);
Springer New York,
2015,
ISBN: 978-1-4614-4077-2,
5
- 19.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-1-4614-4078-9_2
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/BC2015_grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.