Talks and Poster Presentations (with Proceedings-Entry):
F. Roger, A. P. Singulani, S. Carniello, L. Filipovic, S. Selberherr:
"Global Statistical Methodology for the Analysis of Equipment Parameter Effects on TSV Formation";
Talk: International Workshop on CMOS Variability (VARI),
Salvador, Brazil;
2015-09-01
- 2015-09-04; in: "Proceedings of the 6th International Workshop on CMOS Variability (VARI)",
(2015),
ISBN: 978-1-5090-0071-5;
39
- 44.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/VARI.2015.7456561
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/CP2015_Roger_1.pdf
Created from the Publication Database of the Vienna University of Technology.