Publications in Scientific Journals:
L. Filipovic, A. P. Singulani, F. Roger, S. Carniello, S. Selberherr:
"Intrinsic Stress Analysis of Tungsten-Lined Open TSVs";
Microelectronics Reliability,
55
(2015),
9-10;
1843
- 1848.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2015.06.014
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/JB2015_filipovic_1.pdf
Created from the Publication Database of the Vienna University of Technology.