Talks and Poster Presentations (with Proceedings-Entry):
Y. Wimmer, W. Gös, A.-M. El-Sayed, A. Shluger, T. Grasser:
"A Density-Functional Study of Defect Volatility in Amorphous Silicon Dioxide";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Washington DC, USA;
2015-09-09
- 2015-09-11; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",
(2015),
ISBN: 978-1-4673-7860-4;
44
- 47.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/SISPAD.2015.7292254
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2015/CP2015_Wimmer_1.pdf
Created from the Publication Database of the Vienna University of Technology.